Deterministic Test Pattern Generation is a method in built-in self-test that systematically produces predefined test patterns based on a fixed algorithm or model to ensure consistent and repeatable detection of targeted faults.
118
Publications
5.2K
Citations
223
Authors
78
Institutions
Publications per year
2017–2026
5
Variants
Dtpg
Parents
Publications
118
1–5 of 118
Authors
223
- JR
10
h-index
- SR
10
h-index
- HW
9
h-index
- JW
8
h-index
- JT
7
h-index
1–5 of 223
Institutions
78
University of Stuttgart
Stuttgart, Germany
12 h-index
23 publications
1K citations
University of Iowa
Iowa City, United States
10 h-index
20 publications
629 citations
Politecnico di Torino
Turin, Italy
7 h-index
19 publications
329 citations
Poznań University of Technology
Poznan, Poland
6 h-index
8 publications
653 citations
Stanford University
Stanford, United States
6 h-index
9 publications
441 citations
Mentor Technologies
Tulsa, United States
6 h-index
15 publications
1.8K citations
Synopsys (United States)
Mountain View, United States
5 h-index
20 publications
816 citations
Siemens (Hungary)
Budapest, Hungary
5 h-index
13 publications
1.7K citations
1–8 of 78
Venues
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
12 publications · 1.4K citations
11
h-index
- IEEE Transactions on Computers
4 publications · 195 citations
4
h-index
- Journal of Electronic Testing
JETTA · 3 publications · 111 citations
3
h-index
- IEEE Design & Test of Computers
2 publications · 68 citations
2
h-index
- IBM Journal of Research and Development
2 publications · 216 citations
2
h-index
1–5