J.A. Waicukauski - Concepedia

Author

J.A. Waicukauski

Synopsys (United States)

Also Known As

J. A. Waicukauski, J. Waicukauski, J.A. Waicukauski, John A. Waicukauski, John Waicukauski, K Chakrabarty Session

Publications

2.4K

Citations

H-Index

Concepts

All Affiliations

Synopsys (United States)Synopsys (Switzerland)IBM (United States)Mentor Technologies The King's College

About

J.A. Waicukauski is an author at Synopsys (United States) specializing in engineering, computer engineering, and software testing.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	34	2.2K
2	Computer Engineering	21	30	2K
3	Education	3	3	146
4	Health Sciences	3	3	75
5	Medicine	2	2	69

J.A. Waicukauski

Publications

2.3K

Citations

H-Index

Page 1

	Year	Citations
Transition Fault Simulation J.A. Waicukauski, Eric Lindbloom, Barry K. Rosen, IEEE Design & Test of Computers EngineeringVlsi DesignComputer ArchitectureTransition FaultSimulation	1987	401
Failure diagnosis of structured VLSI J.A. Waicukauski, Eric Lindbloom IEEE Design & Test of Computers EngineeringDiagnostic StrategyVerificationDiagnosisSystem-level Design	1989	279
A method for generating weighted random test patterns J.A. Waicukauski, Eric Lindbloom, E. B. Eichelberger, IBM Journal of Research and Development EngineeringVerificationTest Data GenerationFormal VerificationHardware Security	1989	169
On computing the sizes of detected delay faults V. Iyengar, Barry K. Rosen, J.A. Waicukauski IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringVerificationDelay FaultsFormal VerificationDelay Fault Test	1990	113
X-tolerant compression and application of scan-atpg patterns in a bist architecture P. Wohl, J.A. Waicukauski, S.J. Patel, Data CompressionLossy CompressionEngineeringBist ArchitectureComputer Architecture	2004	110
Efficient compression and application of deterministic patterns in a logic BIST architecture P. Wohl, J.A. Waicukauski, Sanjay J. Patel, EngineeringVlsi DesignMem TestingComputer ArchitectureTest Data Generation	2003	102
Transition Fault Simulation by Parallel Pattern Single Fault Propagation. J.A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, International Test Conference	1986	101
Design of compactors for signature-analyzers in built-in self-test P. Wohl, J.A. Waicukauski, T.W. Williams EngineeringMeasurementMem TestingVerificationComputer Architecture	2002	85
Fault detection effectiveness of weighted random patterns J.A. Waicukauski, Eric Lindbloom EngineeringTransition Fault CoverageWrp TestsSoftware AnalysisReliability Engineering	2003	76
ATPG for ultra-large structured designs J.A. Waicukauski, P.A. Shupe, D. Giramma, Cpu TimeAtpg SystemEngineeringAccelerated DesignElectronic Design Automation	2002	72

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