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X-tolerant compression and application of scan-atpg patterns in a bist architecture

Data CompressionLossy CompressionEngineeringBist ArchitectureComputer ArchitectureComputer EngineeringBuilt-in Self-testComputer ScienceParallel ComputingChain CodeMicroelectronicsLossless CompressionX-tolerant CompressionScan-atpg Patterns