V. Brunkhorst is an author at IBM (United States) specializing in built-in self-test, computer architecture, and computer engineering.
Top concepts
EngineeringSoftware TestingBuilt-in Self-testDesign For TestingComputer EngineeringComputer ArchitectureEducationBiophysicsCalibrationMeasurement
Publications per year
2002–2002
2
2
OPMISR: the foundation for compressed ATPG vectors
C. Barnhart, V. Brunkhorst, F. Distler et al. · 2002 · 343 citations
Extending OPMISR beyond 10× scan test efficiency
C. Barnhart, V. Brunkhorst, F. Distler et al. · IEEE Design & Test of Computers · 2002 · 118 citations
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