IEEE Design & Test of Computers · 2002 · 119 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringSystem-on-chip DesignBuilt-in Self-testDesign For TestabilityAsic ImplementationDesign For ScanabilityScan Chain DesignScan Design
Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time.
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OPMISR: the foundation for compressed ATPG vectors
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