Statistics
Publications
5
Citations
769
H-Index
5
Active since
2002
Affiliations
IBM (United States)(Current)
O. Farnsworth is an author at IBM (United States) specializing in engineering, computer engineering, and design for testability.
Publications per year
2002–2003
5
5
OPMISR: the foundation for compressed ATPG vectors
C. Barnhart, V. Brunkhorst, F. Distler et al. · 2002 · 344 citations
Engineering, Computer Engineering, Electrical Engineering +14
A SmartBIST variant with guaranteed encoding
B. Koenemann, C. Barnhart, Brion Keller et al. · 2002 · 269 citations
Extending OPMISR beyond 10× scan test efficiency
C. Barnhart, V. Brunkhorst, F. Distler et al. · IEEE Design & Test of Computers · 2002 · 119 citations
Engineering, Computer Engineering, Electrical Engineering +7
An on-chip self-repair calculation and fusing methodology
D. Anand, B. Cowan, O. Farnsworth et al. · IEEE Design & Test of Computers · 2003 · 23 citations
On-chip repair and an ATE independent fusing methodology
B. Cowan, O. Farnsworth, P. Jakobsen et al. · 2003 · 14 citations
Engineering, Computer Engineering, Electrical Engineering +16
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