IEEE Design & Test of Computers · 2003 · 23 citations · 5 references
EngineeringComputer EngineeringComputer SystemsFault-tolerant ComputingSemiconductor DevicesSystem-on-chip DesignDevice ReliabilityHardware Fault TolerancePartial ReconfigurationProcessor Core DesignBuilt-in Self-repairComplexityHardware ReconfigurationMemory Built-in Self-repairPolysiliconReconfigurationSelf-repairing CircuitsSelf-repairing Hardware
Laser fusing is a standard technique for improving yield with memory reconfiguration and repair, but implementing fusing in production can be challenging and costly. This article introduces an electrically programmable polysilicon fuse and shows how it can reduce fuse area and programming complexity.
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Processor-based built-in self-test for embedded DRAM
J. Dreibelbis, J. Barth, H.L. Kalter et al. · IEEE Journal of Solid-State Circuits · 1998 · 84 citations
Engineering, Computer Engineering, Electrical Engineering +17
On-chip repair and an ATE independent fusing methodology
B. Cowan, O. Farnsworth, P. Jakobsen et al. · 2003 · 14 citations
Engineering, Computer Engineering, Electrical Engineering +16