W.H. McAnney

Self-Testing of Multichip Logic Modules.

Paul H. Bardell, W.H. McAnney · International Test Conference · 1982 · 270 citations

Multichip Logic Modules, Engineering, Automated Reasoning +6

THERE IS INFORMATION IN FAULTY SIGNATURES.

W.H. McAnney, J. Savir · 1987 · 83 citations

Engineering, Data Integrity, Digital Signature +6

Identification of failing tests with cycling registers

J. Savir, W.H. McAnney · 2003 · 74 citations

Reliability, Reliability Engineering, Engineering +14

A multiple seed linear feedback shift register

J. Savir, W.H. McAnney · IEEE Transactions on Computers · 1992 · 50 citations

Engineering, Normal Lfsr Operation, Mixed-signal Integrated Circuit +7

Parallel pseudorandom sequences for built-in test

Paul H. Bardell, W.H. McAnney · 1984 · 39 citations

Compact Generator, Engineering, Program Analysis +14