J. Savir - Concepedia

Author

J. Savir

IBM (United States)

Also Known As

J. SAVIR, J. Savir, Jacob Savir

100

Publications

2.1K

Citations

H-Index

Concepts

All Affiliations

IBM (United States)New Jersey Institute of Technology Poughkeepsie Public Library District

About

J. Savir is an author at IBM (United States) specializing in engineering, software testing, and computer engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	31	2K
2	Computer Engineering	18	22	1.5K
3	Medicine	2	2	39
4	Education	1	1	255
5	Natural Sciences	1	1	29

J. Savir

Publications

Citations

H-Index

Page 1

	Year	Citations
Random Pattern Testability J. Savir, Gary S. Ditlow, Paul H. Bardell IEEE Transactions on Computers EngineeringVerificationTest CoverageTest Data GenerationSoftware Analysis	1984	281
Broad-side delay test J. Savir, S. Patil IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringMeasurementEducationReliability EngineeringTiming Analysis	1994	255
Scan-based transition test J. Savir, S. Patil IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems EngineeringSkewed-load Transition TestVerificationTransition Fault CoverageComputer Architecture	1993	202
Skewed-Load Transition Test: Part I, Calculus J. Savir EngineeringLoad ShiftingTesting TechniqueSkewed-load Transition TestSoftware Testing	2005	171
On broad-side delay test J. Savir, S. Patil EngineeringMeasurementComputer ArchitectureComputational ComplexityReliability Engineering	2002	154
Skewed-Load Transition Test: Part II, Coverage S. Patil, J. Savir EngineeringSkewed-load Transition TestVerificationComputer ArchitectureFormal Verification	2005	94
THERE IS INFORMATION IN FAULTY SIGNATURES. W.H. McAnney, J. Savir EngineeringData IntegrityDigital SignatureInformation SecurityVerification	1987	83
Identification of failing tests with cycling registers J. Savir, W.H. McAnney ReliabilityReliability EngineeringEngineeringMutation-based TestingCycling Register	2003	74
Coefficient-Based Test of Parametric Faults in Analog Circuits Zhen Guo, J. Savir IEEE Transactions on Instrumentation and Measurement ReliabilityElectrical EngineeringReliability EngineeringCoefficient-based TestParametric Faults	2006	52
A multiple seed linear feedback shift register J. Savir, W.H. McAnney IEEE Transactions on Computers EngineeringNormal Lfsr OperationMixed-signal Integrated CircuitComputer EngineeringComputer Architecture	1992	50

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