Concepedia

S. Patil

SP

Statistics

Publications

17

Citations

1.2K

H-Index

14

Active since

1989

Affiliations

IBM (United States)(Current)

University of Illinois Urbana-Champaign

Intel (United States)

Microelectronics Research Development (United States)

Poughkeepsie Public Library District

S. Patil is an author at IBM (United States) specializing in computer engineering, design for testability, and computer science.

Publications per year

1989–2025

17

Publications

17

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

Engineering, Computer Engineering, Computer Science +14

Scan-based transition test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 203 citations

Engineering, Computer Engineering, Computer Science +13

On broad-side delay test

J. Savir, S. Patil · 2002 · 154 citations

Engineering, Computer Engineering, Electrical Engineering +10

Skewed-Load Transition Test: Part II, Coverage

S. Patil, J. Savir · 2005 · 94 citations

Engineering, Computer Engineering, Computer Science +12

A parallel branch and bound algorithm for test generation

S. Patil, P. Banerjee · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 76 citations

Computing, Computer Engineering, Computer Science +13

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