Scan Chain Design

Scan Chain Design is a design methodology in digital integrated circuit testing that integrates sequential logic elements into a shift register structure during test mode to enable controllability and observability of internal circuit states.

641

Publications

25.8K

Citations

1.1K

Authors

276

Institutions

Publications per year

2017–2026

Parents

Digital Integrated Circuit DesignDigital Logic Design

Publications

641

LFSR-coded test patterns for scan designs

B. Koenemann · Medical Entomology and Zoology · 1991 · 510 citations

Engineering, Computer Science, Design Automation +7

Static compaction techniques to control scan vector power dissipation

Rajkumar Sankaralingam, R. Oruganti, Nur A. Touba · 2002 · 353 citations

Engineering, Computer Engineering, Computer Science +17

Scan based side channel attack on dedicated hardware implementations of Data Encryption Standard

Bo Yang, Kaijie Wu, Ramesh Karri · 2005 · 345 citations

Computing, Computer Engineering, Computer Science +14

Reducing test application time for full scan embedded cores

İlker Hamzaoğlu, J.H. Patel · 2003 · 337 citations

Engineering, Computer Engineering, Computer Science +15

Techniques for minimizing power dissipation in scan and combinational circuits during test application

V. Dabholkar, S. Chakravarty, Irith Pomeranz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1998 · 320 citations

Engineering, Computer Engineering, Computer Science +17

1–5 of 641

Authors

1.1K

SR
S.M. Reddy
University of Iowa, United States
41 publications · 2.1K citations
25
h-index
JR
Janusz Rajski
Mentor Technologies, United States
34 publications · 1.7K citations
25
h-index
IP
Irith Pomeranz
University of Iowa, United States
30 publications · 1.5K citations
20
h-index
JT
Jerzy Tyszer
Poznań University of Technology, Poland
25 publications · 965 citations
17
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
20 publications · 766 citations
15
h-index

1–5 of 1.1K

Institutions

276

1–8 of 276

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
46 publications · 2.6K citations
26
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
25 publications · 715 citations
16
h-index
IEEE Design & Test of Computers
19 publications · 1.3K citations
15
h-index
IEEE Transactions on Computers
16 publications · 900 citations
14
h-index
Journal of Electronic Testing
JETTA · 16 publications · 510 citations
13
h-index

1–5