Journal of Electronic Testing

Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen · 2002 · 404 citations

Engineering, Computer Engineering, Computer Science +14

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor · 2014 · 247 citations

Engineering, Computer Engineering, Electrical Engineering +12

On-Line Testing for VLSI—A Compendium of Approaches

M. Nicolaidis, Y. Zorian · 1998 · 246 citations

Engineering, Computer Engineering, Electrical Engineering +12

Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes

Debaleena Das, Nur A. Touba · 1999 · 124 citations

Engineering, Computer Engineering, Computer Science +17

On IEEE P1500's Standard for Embedded Core Test

Erik Jan Marinissen, Rohit Kapur, M. Lousberg et al. · 2002 · 121 citations

Engineering, Computer Engineering, Electrical Engineering +13