Statistics
Publications
13
Citations
1.1K
H-Index
12
Active since
2001
M. Lousberg is an author at Philips (Netherlands) specializing in engineering, design for testability, and computer engineering.
Publications per year
2001–2007
13
13
A structured and scalable mechanism for test access to embedded reusable cores
Erik Jan Marinissen, R. Arendsen, G. G. J. Bos et al. · 2002 · 344 citations
Wrapper design for embedded core test
Erik Jan Marinissen, Sandeep Goel, M. Lousberg · 2002 · 224 citations
Defect-based delay testing of resistive vias-contacts a critical evaluation
K. Baker, G. Gronthoud, M. Lousberg et al. · 2003 · 129 citations
Engineering, Computer Engineering, Electrical Engineering +14
On IEEE P1500's Standard for Embedded Core Test
Erik Jan Marinissen, Rohit Kapur, M. Lousberg et al. · Journal of Electronic Testing · 2002 · 121 citations
Engineering, Computer Engineering, Electrical Engineering +13
An effective diagnosis method to support yield improvement
C. Hora, R. Segers, S. Eichenberger et al. · 2003 · 64 citations
Engineering, Electrical Engineering, Manufacturing Engineering +17
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