S. Eichenberger

On hazard-free patterns for fine-delay fault testing

B. Kruseman, A.K. Majhi, G. Gronthoud et al. · 2005 · 108 citations

Resistive Opens, Engineering, Verification +18

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs

Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz et al. · 2009 · 87 citations

Engineering, Vlsi Design, Atpg Tools +21

Power Supply Noise in Delay Testing

Jing Wang, D.M.H. Walker, Ananta K. Majhi et al. · 2006 · 80 citations

Electrical Engineering, Noise Impact, Engineering +11

Systematic defects in deep sub-micron technologies

B. Kruseman, A.K. Majhi, C. Hora et al. · 2005 · 67 citations

Engineering, Verification, Computer Architecture +22

Delay defect screening using process monitor structures

Subhasish Mitra, E. Volkerink, E.J. McCluskey et al. · 2004 · 66 citations

Engineering, Industrial Engineering, Mem Testing +21