Statistics
Publications
15
Citations
678
H-Index
12
Active since
2003
S. Eichenberger is an author at NXP (Netherlands) specializing in computer engineering, engineering, and electrical engineering.
Publications per year
2003–2011
15
15
On hazard-free patterns for fine-delay fault testing
B. Kruseman, A.K. Majhi, G. Gronthoud et al. · 2005 · 109 citations
Engineering, Computer Engineering, Fault-tolerant Computing +14
Power Supply Noise in Delay Testing
Jing Wang, D.M.H. Walker, Ananta K. Majhi et al. · 2006 · 80 citations
Engineering, Computer Engineering, Electrical Engineering +17
Delay defect screening using process monitor structures
Subhasish Mitra, E. Volkerink, E.J. McCluskey et al. · 2004 · 68 citations
Engineering, Computer Engineering, Electrical Engineering +17
Systematic defects in deep sub-micron technologies
B. Kruseman, A.K. Majhi, C. Hora et al. · 2005 · 67 citations
Engineering, Computer Engineering, Fault-tolerant Computing +9
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