A.K. Majhi

On hazard-free patterns for fine-delay fault testing

B. Kruseman, A.K. Majhi, G. Gronthoud et al. · 2005 · 108 citations

Resistive Opens, Engineering, Verification +18

Systematic defects in deep sub-micron technologies

B. Kruseman, A.K. Majhi, C. Hora et al. · 2005 · 67 citations

Engineering, Verification, Computer Architecture +22

Line coverage of path delay faults

A.K. Majhi, V.D. Agrawak, J. Jacob et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2000 · 56 citations

Reliability Engineering, Engineering, Software Testing +13

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

S. Eichenberger, J. Geuzebroek, C. Hora et al. · 2008 · 39 citations

Volume Diagnosis, Engineering, Machine Learning +28

Delay fault models and coverage

A.K. Majhi, Vishwani D. Agrawal · 2002 · 37 citations

Electrical Engineering, Reliability Engineering, Engineering +13