B. Kruseman

On hazard-free patterns for fine-delay fault testing

B. Kruseman, A.K. Majhi, G. Gronthoud et al. · 2005 · 109 citations

Engineering, Computer Engineering, Fault-tolerant Computing +14

Power Supply Noise in Delay Testing

Jing Wang, D.M.H. Walker, Ananta K. Majhi et al. · 2006 · 80 citations

Engineering, Computer Engineering, Electrical Engineering +17

Systematic defects in deep sub-micron technologies

B. Kruseman, A.K. Majhi, C. Hora et al. · 2005 · 67 citations

Engineering, Computer Engineering, Fault-tolerant Computing +9

Diagnosis of Local Spot Defects in Analog Circuits

Ke Huang, Haralampos‐G. Stratigopoulos, S. Mir et al. · IEEE Transactions on Instrumentation and Measurement · 2012 · 54 citations

Engineering, Computer Science, Electrical Engineering +17

Transient current testing of 0.25 μm CMOS devices

B. Kruseman, Peter J. Janssen, V. Zieren · 2003 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +11