V. Zieren

Magnetic-field-sensitive multicollector n-p-n transistors

V. Zieren, B.P.M. Duyndam · IEEE Transactions on Electron Devices · 1982 · 83 citations

Vector Sensor, Magnetism, Electrical Engineering +12

Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs

Manoj Sachdev, Peter J. Janssen, V. Zieren · 2002 · 72 citations

Electrical Engineering, I/sub Ddt/, Vlsi Design +14

A Back-Wafer Contacted Silicon-On-Glass Integrated Bipolar Process—Part I: The Conflict Electrical Versus Thermal Isolation

Lis K. Nanver, N. Nenadović, Vincenzo d’Alessandro et al. · IEEE Transactions on Electron Devices · 2004 · 65 citations

Electrical Engineering, Wafer Scale Processing, Engineering +13

Transient current testing of 0.25 μm CMOS devices

B. Kruseman, Peter J. Janssen, V. Zieren · 2003 · 51 citations

Hardware Security, Electrical Engineering, Engineering +15

Modeling of light-emission spectra measured on silicon nanometer-scale diode antifuses

N. Akil, Vincent Houtsma, P. LeMinh et al. · Journal of Applied Physics · 2000 · 45 citations

Engineering, Semiconductor Materials, Optoelectronic Devices +23