E. Volkerink

Packet-based input test data compression techniques

E. Volkerink, A. Khoche, Subhasish Mitra · 2003 · 67 citations

Lossy Compression, Engineering, Computer Architecture +16

Efficient seed utilization for reseeding based compression [logic testing]

E. Volkerink, Subhasish Mitra · 2003 · 66 citations

Engineering, Efficient Seed Utilization, Computer Architecture +18

Delay defect screening using process monitor structures

Subhasish Mitra, E. Volkerink, E.J. McCluskey et al. · 2004 · 66 citations

Engineering, Industrial Engineering, Mem Testing +21

Test economics for multi-site test with modern cost reduction techniques

E. Volkerink, A. Khoche, Jochen Rivoir et al. · 2003 · 60 citations

Engineering, Economic Benefits, Test Economics +17

ELF-Murphy data on defects and test sets

E.J. McCluskey, Ahmed Al-Yamani, J.C.-M. Li et al. · 2004 · 52 citations

Engineering, Mem Testing, Verification +22