K. Baker

Defect-based delay testing of resistive vias-contacts a critical evaluation

K. Baker, G. Gronthoud, M. Lousberg et al. · 2003 · 129 citations

Engineering, Computer Engineering, Electrical Engineering +14

Shmoo plotting: the black art of IC testing

K. Baker, J. Van Beers · IEEE Design & Test of Computers · 1997 · 88 citations

Engineering, Manufacturing Engineering, Experimental Design +6

Analogue fault simulation based on layout dependent fault models

Russell Harvey, A. Richardson, E.M.J.G. Bruls et al. · 2002 · 65 citations

Engineering, Electrical Engineering, Analog Electronics +16

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

W. G. MOORE, G. Gronthoud, K. Baker et al. · 2002 · 48 citations

Engineering, Computer Engineering, Electrical Engineering +17

I/sub DDQ/ testing because 'zero defects isn't enough': a Philips perspective

K. Baker, Bart Verhelst · 2002 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +11