I/sub DDQ/ testing because 'zero defects isn't enough': a Philips perspective

Abstract

The application of I/sub DDQ/ testing to CMOS devices at Philips is discussed. Philips' major IC lab facilities in Europe and the United States have a long history of using I/sub DDQ/ in production testing of high-volume CMOS SSI and MSI. The internally developed Philips digital component ATE (automatic test equipment), the LOCMOS tester, had the unique feature of an I/sub DDQ/ capability of better than 1 mu A on all channels. The need for a fast and sensitive I/sub DDQ/ monitor is pointed out. An examination of the future of I/sub DDQ/ from a device quality viewpoint indicates that the really critical issues for research into I/sub DDQ/ are related to stress and accelerated life testing.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>