Bart Verhelst

Functional and I/sub DDQ/ testing on a static RAM

R. Meershoek, Bart Verhelst, R. McInerney et al. · 2002 · 47 citations

Hardware Security, Embedded Srams, Electrical Engineering +13

I/sub DDQ/ testing because 'zero defects isn't enough': a Philips perspective

K. Baker, Bart Verhelst · 2002 · 47 citations

Engineering, Vlsi Design, Mem Testing +21

Introducing small storage capacity at residential PV installations to prevent overvoltages

Jan Cappelle, Johan Vanalme, Stijn Vispoel et al. · 2011 · 40 citations · Full text

Distributed Energy System, Engineering, Energy Efficiency +21

Maximum power injection acceptance in a residential area

Colin Debruyne, Jan Desmet, Johan Vanalme et al. · Renewable Energy and Power Quality Journal · 2010 · 18 citations · Full text

Preventing overvoltages in PV grids by integration of small storage capacity

Colin Debruyne, Johan Vanalme, Bart Verhelst et al. · 2011 · 15 citations

Distributed Energy System, Engineering, Simultaneous Power Injection +18