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Shmoo plotting: the black art of IC testing

K. Baker, J. Van Beers

IEEE Design & Test of Computers · 1997 · 88 citations · 1 references

DOI

Concepts

Abstract

Obtaining higher yields from IC fabrication is a never ending goal. Toward that end, shmoo plotting can help bridge the gap between design and test and ultimately show ways to improve a product, process, or manufacturing test program.

References

1

VLSI Yield Prediction and Estimation: A Unified Framework

W. Maly, Andrzej J. Strojwas, S.W. Director · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1986 · 151 citations

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