Yield Enhancement

Yield Enhancement is a methodological framework in integrated circuit fabrication that systematically identifies and mitigates process-induced defects and variability to increase the proportion of functional dies per wafer.

1.8K

Publications

76.3K

Citations

9.3K

Authors

1.9K

Institutions

Publications per year

2017–2026

499

Authors

9.3K

  1. CC
    Chen–Fu Chien

    National Tsing Hua University, Taiwan

    17 publications · 1.1K citations

    14

    h-index

  2. KR
    Kaushik Roy

    Purdue University West Lafayette, United States

    14 publications · 1.3K citations

    12

    h-index

  3. IK
    Israel Koren

    University of Massachusetts Amherst, United States

    12 publications · 568 citations

    11

    h-index

  4. RE
    R. E. Knox

    Agriculture and Agri-Food Canada, Canada

    8 publications · 304 citations

    8

    h-index

  5. JM
    J. M. Clarke

    Agriculture and Agri-Food Canada, Canada

    7 publications · 288 citations

    7

    h-index

1–5 of 9.3K

Venues

  1. Crop Science

    34 publications · 1.4K citations

    23

    h-index

  2. IEEE Transactions on Semiconductor Manufacturing

    41 publications · 1.2K citations

    21

    h-index

  3. Agronomy Journal

    22 publications · 1.2K citations

    20

    h-index

  4. 20

    h-index

  5. Green Chemistry

    GC · 18 publications · 1.3K citations

    18

    h-index

1–5