Yield Enhancement
Yield Enhancement is a methodological framework in integrated circuit fabrication that systematically identifies and mitigates process-induced defects and variability to increase the proportion of functional dies per wafer.
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2017–2026
499
1.8K
Open Language Learning for Information Extraction
Michael Schmitz, Stephen Soderland, Robert Bart et al. · 2012 · 717 citations
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Chinese Academy of Sciences
Beijing, China
30 h-index
182 publications
22K citations
Purdue University West Lafayette
West Lafayette, United States
18 h-index
62 publications
4.6K citations
National Tsing Hua University
Hsinchu, Taiwan
18 h-index
79 publications
3.7K citations
IBM (United States)
Armonk, United States
18 h-index
213 publications
7.6K citations
Chinese Academy of Agricultural Sciences
Beijing, China
15 h-index
101 publications
7.4K citations
University of Chinese Academy of Sciences
Beijing, China
15 h-index
49 publications
7.8K citations

University of Massachusetts Amherst
Amherst Center, United States
14 h-index
33 publications
1.4K citations

Agricultural Research Service
Washington, United States
14 h-index
47 publications
1.7K citations
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41 publications · 1.2K citations
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25 publications · 1.6K citations
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GC · 18 publications · 1.3K citations
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