Design For Scanability

Design for Scanability is a design methodology within the field of digital circuit testing that integrates specialized sequential structures into a circuit’s architecture to enable controlled and observable state transitions during test application, thereby facilitating efficient fault detection and diagnosis.

282

Publications

11.6K

Citations

616

Authors

193

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

282

LFSR-coded test patterns for scan designs

B. Koenemann · Medical Entomology and Zoology · 1991 · 510 citations

Engineering, Computer Science, Design Automation +7

Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick et al. · IEEE Transactions on Computers · 1995 · 408 citations

Engineering, Computer Engineering, Computer Science +14

Reducing test application time for full scan embedded cores

İlker Hamzaoğlu, J.H. Patel · 2003 · 337 citations

Engineering, Computer Engineering, Computer Science +15

Techniques for minimizing power dissipation in scan and combinational circuits during test application

V. Dabholkar, S. Chakravarty, Irith Pomeranz et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1998 · 320 citations

Engineering, Computer Engineering, Computer Science +17

Minimizing power consumption in scan testing: pattern generation and DFT techniques

Kenneth M. Butler, J. Saxena, Ankit Jain et al. · 2005 · 275 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 282

Authors

616

XW
Xiaoqing Wen
Kyushu Institute of Technology, Japan
13 publications · 500 citations
13
h-index
SR
S.M. Reddy
University of Iowa, United States
15 publications · 1.1K citations
13
h-index
JR
Janusz Rajski
Mentor Technologies, United States
14 publications · 1.4K citations
13
h-index
SK
Seiji Kajihara
Kyushu Institute of Technology, Japan
12 publications · 437 citations
12
h-index
IP
Irith Pomeranz
University of Iowa, United States
14 publications · 848 citations
12
h-index

1–5 of 616

Institutions

193

1–8 of 193

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
11 publications · 910 citations
11
h-index
IEEE Design & Test of Computers
10 publications · 484 citations
10
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
9 publications · 255 citations
9
h-index
Journal of Electronic Testing
JETTA · 9 publications · 201 citations
9
h-index
IEEE Transactions on Computers
8 publications · 696 citations
8
h-index

1–5