P. Wohl

X-tolerant compression and application of scan-atpg patterns in a bist architecture

P. Wohl, J.A. Waicukauski, S.J. Patel et al. · 2004 · 110 citations

Data Compression, Lossy Compression, Engineering +11

Efficient compression and application of deterministic patterns in a logic BIST architecture

P. Wohl, J.A. Waicukauski, Sanjay J. Patel et al. · 2003 · 102 citations

Engineering, Vlsi Design, Mem Testing +22

Design of compactors for signature-analyzers in built-in self-test

P. Wohl, J.A. Waicukauski, T.W. Williams · 2002 · 85 citations

Engineering, Measurement, Mem Testing +23

Fully X-tolerant combinational scan compression

P. Wohl, J.A. Waicukauski, S. Ramnath · 2007 · 55 citations

Lossy Compression, Test Time Compressions, Engineering +11

Minimizing the Impact of Scan Compression

P. Wohl, J.A. Waicukauski, R. Kapur et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 54 citations

Lossy Compression, Engineering, Scan Compression +21