T.W. Williams

A logic design structure for LSI testability

E. B. Eichelberger, T.W. Williams · Design Automation Conference · 1977 · 837 citations

Engineering, Computer Engineering, Computer Systems +14

Design for testability—A survey

T.W. Williams, Kenneth P. Parker · Proceedings of the IEEE · 1983 · 393 citations

Engineering, Systems Engineering, Fault Tolerance +8

Bounds and analysis of aliasing errors in linear feedback shift registers

T.W. Williams, Wilfried Daehn, M. Gruetzner et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 106 citations

Computing, Computer Engineering, Computer Science +12

Design for testability of mixed signal integrated circuits

K.D. Wagner, T.W. Williams · 2003 · 102 citations

Engineering, Computer Engineering, Electrical Engineering +14

Aliasing Errors in Signature in Analysis Registers

T.W. Williams, Wilfried Daehn, M. Gruetzner et al. · IEEE Design & Test of Computers · 1987 · 93 citations

Computing, Computer Engineering, Computer Science +10