Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium

Circuit Failure Prediction and Its Application to Transistor Aging

Mridul Agarwal, Bipul C. Paul, Ming Zhang et al. · 2007 · 446 citations

Engineering, Computer Engineering, Electrical Engineering +17

Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code

Avijit Dutta, Nur A. Touba · 2007 · 177 citations

Engineering, Computer Engineering, Computer Science +17

VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips

Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia · 2007 · 104 citations

Computing, Computer Engineering, Computer Science +17

Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors

Michael Nicolaidis, Renaud Perez, Dan Alexandrescu · 2008 · 75 citations

Engineering, Computer Engineering, Electrical Engineering +16

Test-Pattern Grading and Pattern Selection for Small-Delay Defects

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor · 2008 · 72 citations

Engineering, Computer Engineering, Electrical Engineering +17