Bipul C. Paul

Circuit Failure Prediction and Its Application to Transistor Aging

Mridul Agarwal, Bipul C. Paul, Ming Zhang et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 444 citations

Engineering, Vlsi Design, Computer Architecture +16

Robust subthreshold logic for ultra-low power operation

H. Soeleman, Kaushik Roy, Bipul C. Paul · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2001 · 287 citations

Low-power Electronics, Hardware Security, Electrical Engineering +10

Impact of NBTI on the temporal performance degradation of digital circuits

Bipul C. Paul, Kunhyuk Kang, Haldun Küflüoğlu et al. · IEEE Electron Device Letters · 2005 · 285 citations

Engineering, Vlsi Design, Computer Architecture +19

Modeling and Optimization of Fringe Capacitance of Nanoscale DGMOS Devices

Aditya Bansal, Bipul C. Paul, Kaushik Roy · IEEE Transactions on Electron Devices · 2005 · 205 citations

Device Modeling, Electrical Engineering, Nanoscale System +13

A process-tolerant cache architecture for improved yield in nanoscale technologies

Amit Agarwal, Bipul C. Paul, Hamid Mahmoodi et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2005 · 198 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +18