Haldun Küflüoğlu

A comprehensive model for PMOS NBTI degradation: Recent progress

Muhammad A. Alam, Haldun Küflüoğlu, Dhanoop Varghese et al. · Microelectronics Reliability · 2006 · 292 citations

Device Modeling, Electrical Engineering, Engineering +4

Impact of NBTI on the temporal performance degradation of digital circuits

Bipul C. Paul, Kunhyuk Kang, Haldun Küflüoğlu et al. · IEEE Electron Device Letters · 2005 · 285 citations

Engineering, Vlsi Design, Computer Architecture +19

Recent Issues in Negative-Bias Temperature Instability: Initial Degradation, Field Dependence of Interface Trap Generation, Hole Trapping Effects, and Relaxation

Ahmad E. Islam, Haldun Küflüoğlu, Dhanoop Varghese et al. · IEEE Transactions on Electron Devices · 2007 · 258 citations

Electrical Engineering, Fast-transient Nbti Recovery, Engineering +14

Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis

Kunhyuk Kang, Haldun Küflüoğlu, Kaushik Roy et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2007 · 160 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +19

Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Bipul C. Paul, Kunhyuk Kang, Haldun Küflüoğlu et al. · 2006 · 156 citations

Temporal Reliability Degradation, Engineering, Vlsi Design +20