Kunhyuk Kang

Impact of NBTI on the temporal performance degradation of digital circuits

Bipul C. Paul, Kunhyuk Kang, Haldun Küflüoğlu et al. · IEEE Electron Device Letters · 2005 · 285 citations

Engineering, Vlsi Design, Computer Architecture +19

Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis

Kunhyuk Kang, Haldun Küflüoğlu, Kaushik Roy et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2007 · 160 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +19

Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Bipul C. Paul, Kunhyuk Kang, Haldun Küflüoğlu et al. · 2006 · 156 citations

Temporal Reliability Degradation, Engineering, Vlsi Design +20

Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance

Kunhyuk Kang, Sang Phill Park, Kaushik Roy et al. · International Conference on Computer Aided Design · 2007 · 84 citations

Lifetime Circuit Performance, Electrical Engineering, Reliability Engineering +15

NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?

Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park et al. · Asia and South Pacific Design Automation Conference · 2008 · 77 citations

Non-volatile Memory, Engineering, Computer Architecture +19