Mahmut Yilmaz

Test-Pattern Grading and Pattern Selection for Small-Delay Defects

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2008 · 69 citations

Engineering, Vlsi Design, Small Delay Defects +16

Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2010 · 65 citations

Small-delay Defects, Electrical Engineering, Physical Design (Electronics) +15

Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

Mahmut Yilmaz, Krishnendu Chakrabarty, Mark Tehranipoor · 2008 · 42 citations

Engineering, Vlsi Design, Computer Architecture +18

Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2012 · 30 citations

Reliability, Hardware Security, Electrical Engineering +15

Special Session: In-System-Test (IST) Architecture for NVIDIA Drive-AGX Platforms

Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane et al. · 2019 · 19 citations

Engineering, Computer Architecture, Ist Architecture +18