Dan Alexandrescu - Concepedia

Author

Dan Alexandrescu

Amplitude Technologies (France)ORCID

Also Known As

Alexandrescu, D., Alexandrescu, Dan, D. Alexandrescu, Dan Alexandrescu

Publications

Citations

H-Index

Concepts

All Affiliations

Amplitude Technologies (France)Techniques of Informatics and Microelectronics for Integrated Systems Architecture Polytechnic University of Turin European Space Research and Technology Centre Karlsruhe Institute of Technology

About

Dan Alexandrescu is an author at Amplitude Technologies (France) specializing in engineering, computer engineering, and computer architecture.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	27	843
2	Computer Engineering	16	25	801
3	Applied Physics	5	5	164
4	Education	2	2	39
5	Natural Sciences	1	1	11

Dan Alexandrescu

Publications

921

Citations

H-Index

Page 1

	Year	Citations
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy Lorena Anghel, Dan Alexandrescu, M. Nicolaidis Symposium on Integrated Circuits and Systems Design EngineeringError Control TechniqueComputer ArchitectureHardware SecurityReliability Engineering	2000	98
Evaluation of a soft error tolerance technique based on time and/or space redundancy Lorena Anghel, Dan Alexandrescu, M. Nicolaidis EngineeringError Control TechniqueComputer ArchitectureHardware SecurityReliability Engineering	2002	85
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors Michael Nicolaidis, Renaud Perez, Dan Alexandrescu Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium Low-power ElectronicsHardware SecurityElectrical EngineeringNon-volatile MemoryEngineering	2008	75
New methods for evaluating the impact of single event transients in VDSM ICs Dan Alexandrescu, Lorena Anghel, M. Nicolaidis EngineeringVlsi DesignSingle Event TransientComputer ArchitectureSimulation	2003	68
Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor Mojtaba Ebrahimi, Adrian Evans, Mehdi B. Tahoori, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Hardware ModelingEngineeringVlsi DesignError Control TechniqueHardware Verification Language	2015	55
Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs Jinhyun Noh, V. Correas, Soon Young Lee, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringHardware Reliability	2015	54
Detailed SET Measurement and Characterization of a 65 nm Bulk Technology Maximilien Glorieux, Adrian Evans, Véronique Ferlet-Cavrois, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNm Bulk TechnologyComputer ArchitectureSilicon On Insulator	2016	33
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales Mojtaba Ebrahimi, Adrian Evans, Mehdi B. Tahoori, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 Hardware ModelingEngineeringVlsi DesignComputer ArchitectureEmbedded Systems	2014	31
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs Dan Alexandrescu, Enrico Costenaro, M. Nicolaidis EngineeringPower Optimization (Eda)Computer ArchitectureHardware SecurityReliability Engineering	2011	30
Design for Soft Error Resiliency in Internet Core Routers A.L. Silburt, Adrian Evans, Ian Perryman, IEEE Transactions on Nuclear Science EngineeringComputer ArchitectureRandom Fault InjectionHardware SecurityReliability Engineering	2009	27

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