V. Correas

Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

Jinhyun Noh, V. Correas, Soon Young Lee et al. · IEEE Transactions on Nuclear Science · 2015 · 54 citations

Device Modeling, Electrical Engineering, Semiconductor Device +14

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

V. Correas, F. Saigne, B. Sagnes et al. · IEEE Transactions on Nuclear Science · 2009 · 41 citations

Electrical Engineering, Ion Implantation, Engineering +11

Innovative Simulations of Heavy Ion Cross Sections in 130 nm CMOS SRAM

V. Correas, Frédéric Saigné, B. Sagnes et al. · IEEE Transactions on Nuclear Science · 2007 · 33 citations

Engineering, Vlsi Design, Computer Architecture +17

Simulation Tool for the Prediction of Heavy Ion Cross Section of Innovative 130-nm SRAMs

V. Correas, Frédéric Saigné, Bruno Sagnes et al. · IEEE Transactions on Nuclear Science · 2008 · 18 citations

Engineering, Vlsi Design, Computer Architecture +20