Avijit Dutta

Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code

Avijit Dutta, Nur A. Touba · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 173 citations

Non-volatile Memory, Single Event Upset, Engineering +18

LRBC: a lightweight block cipher design for resource constrained IoT devices

Arpita Biswas, Abhishek Majumdar, Sourav Nath et al. · Journal of Ambient Intelligence and Humanized Computing · 2020 · 56 citations

Data Encryption Standard, Engineering, Information Security +9

Reliable Network-on-Chip Using a Low Cost Unequal Error Protection Code

Avijit Dutta, Nur A. Touba · 2007 · 38 citations

Hardware Security, Single Event Upset, Reliability Engineering +13

Using Limited Dependence Sequential Expansion for Decompressing Test Vectors

Avijit Dutta, Nur A. Touba · Proceedings/Proceedings - International Test Conference · 2006 · 29 citations

Mathematical Programming, Sequential Expansion, Engineering +14

Single Key Variant of PMAC_Plus

Nilanjan Datta, Avijit Dutta, Mridul Nandi et al. · IACR Transactions on Symmetric Cryptology · 2017 · 28 citations · Full text

Hardware Security, Cryptographic Primitive, Engineering +14