Microprocessors and Microsystems · 1989 · 639 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsVlsi DesignBuilt-in Self-testClock Distribution NetworksDesign For TestabilityDevice CharacterizationTiming AnalysisVery-large-scale Integration LayoutBuilt-in TestBuilt-in Test ArchitectureDigital Circuit Self-testingLogic Built-in Self-testPseudo-random Pattern Generation