Logic Bist

Logic Bist is a design-for-testability methodology that integrates self-test capability into digital circuits by embedding on-chip test pattern generation and response analysis circuitry to enable autonomous fault detection and diagnosis.

445

Publications

14.4K

Citations

884

Authors

252

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

445

OPMISR: the foundation for compressed ATPG vectors

C. Barnhart, V. Brunkhorst, F. Distler et al. · 2002 · 344 citations

Engineering, Computer Engineering, Electrical Engineering +14

Logic BIST for large industrial designs: real issues and case studies

G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 284 citations

Engineering, Computer Engineering, Electrical Engineering +16

A SmartBIST variant with guaranteed encoding

B. Koenemann, C. Barnhart, Brion Keller et al. · 2002 · 269 citations

Engineering, Computer Engineering, Computer Science +15

Software-based self-testing methodology for processor cores

Li Chen, S. Dey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2001 · 231 citations

Engineering, Computer Engineering, Computer Science +16

Bit-flipping BIST

Hans-Joachim Wunderlich, Gundolf Kiefer · International Conference on Computer Aided Design · 1996 · 208 citations

Engineering, Computer Engineering, Computer Science +15

1–5 of 445

Authors

884

CE
Charles E. Stroud
University of Kentucky, United States
18 publications · 834 citations
17
h-index
HW
Hans-Joachim Wunderlich
University of Stuttgart, Germany
14 publications · 957 citations
14
h-index
JR
Janusz Rajski
Mentor Technologies, United States
15 publications · 464 citations
12
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
17 publications · 358 citations
12
h-index
JT
Jerzy Tyszer
Poznań University of Technology, Poland
12 publications · 334 citations
11
h-index

1–5 of 884

Institutions

252

1–8 of 252

Venues

IEEE Transactions on Computers
23 publications · 1K citations
19
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
23 publications · 978 citations
17
h-index
Journal of Electronic Testing
JETTA · 19 publications · 445 citations
14
h-index
IEEE Design & Test of Computers
11 publications · 542 citations
11
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
12 publications · 296 citations
11
h-index

1–5