Concurrent Self-test
Concurrent Self-Test is a built-in self-test technique that performs fault detection during normal system operation by interleaving test procedures with functional tasks, thereby enabling real-time diagnostic coverage without interrupting service.
31
Publications
1K
Citations
79
Authors
46
Institutions
Publications per year
2017–2026
3
Variants
Concurrent Bist
Parents
31
Yanjing Li, Samy Makar, Subhasish Mitra · 2008 · 148 citations
A self-testing ALU using built-in current sensing
P. Nigh, W. Maly · 1989 · 47 citations
Engineering, Computer Engineering, Electrical Engineering +16
1–5 of 31
79
4
h-index
4
h-index
3
h-index
2
h-index
2
h-index
1–5 of 79
46
Stanford University
Stanford, United States
4 h-index
9 publications
582 citations
National Chung Cheng University
Minxiong, Taiwan
2 h-index
4 publications
57 citations
University of Wisconsin–Madison
Madison, United States
2 h-index
3 publications
109 citations

National and Kapodistrian University of Athens
Athens, Greece
2 h-index
5 publications
189 citations
Technological Educational Institute of Athens
Athens, Greece
2 h-index
3 publications
87 citations
RTI International
Durham, United States
2 h-index
3 publications
55 citations
National Cheng Kung University
Tainan City, Taiwan
2 h-index
4 publications
75 citations
Techniques of Informatics and Microelectronics for Integrated Systems Architecture
Grenoble, France
2 h-index
5 publications
161 citations
1–8 of 46
2 publications · 31 citations
2
h-index
2 publications · 34 citations
2
h-index
1 publications · 11 citations
1
h-index
1 publications · 22 citations
1
h-index
1 publications · 27 citations
1
h-index
1–5