Concurrent Self-test

Concurrent Self-Test is a built-in self-test technique that performs fault detection during normal system operation by interleaving test procedures with functional tasks, thereby enabling real-time diagnostic coverage without interrupting service.

31

Publications

1K

Citations

79

Authors

46

Institutions

Publications per year

2017–2026

3

Variants

Concurrent Bist

Authors

79

  1. YL
    Yanjing Li

    Stanford University, United States

    4 publications · 264 citations

    4

    h-index

  2. SM
    Subhasish Mitra

    Stanford University, United States

    4 publications · 264 citations

    4

    h-index

  3. IV
    Ioannis Voyiatzis

    Technological Educational Institute of Athens, Greece

    3 publications · 95 citations

    3

    h-index

  4. KK
    Kewal K. Saluja

    University of Wisconsin–Madison, United States

    2 publications · 68 citations

    2

    h-index

  5. DH
    Der‐Chen Huang

    National Chung Hsing University, Taiwan

    2 publications · 33 citations

    2

    h-index

1–5 of 79

Venues

  1. IEEE Transactions on Computers

    2 publications · 31 citations

    2

    h-index

  2. 2

    h-index

  3. International Journal of Production Economics

    1 publications · 11 citations

    1

    h-index

  4. Family Practice

    1 publications · 22 citations

    1

    h-index

  5. VLSI design

    1 publications · 27 citations

    1

    h-index

1–5