At-speed Testing

At-Speed Testing is a built-in self-test methodology that distinguishes itself by applying test patterns and capturing responses at the operational clock frequency of the circuit under test to detect speed-dependent faults.

248

Publications

8.7K

Citations

658

Authors

165

Institutions

Publications per year

2017–2026

Parents

Built-in Self-testDesign For Testability

Publications

248

A case study of ir-drop in structured at-speed testing

J. Saxena, Kenneth M. Butler, Vinay Jayaram et al. · 2004 · 403 citations

Engineering, Computer Engineering, Electrical Engineering +14

Logic BIST for large industrial designs: real issues and case studies

G. Hetherington, T. Fryars, N. Tamarapalli et al. · 2003 · 284 citations

Engineering, Computer Engineering, Electrical Engineering +16

Minimizing power consumption in scan testing: pattern generation and DFT techniques

Kenneth M. Butler, J. Saxena, Ankit Jain et al. · 2005 · 275 citations

Engineering, Computer Engineering, Electrical Engineering +17

At-speed delay characterization for IC authentication and Trojan Horse detection

Jie Li, John Lach · 2008 · 272 citations

Engineering, Computer Engineering, Electrical Engineering +15

Software-based self-testing methodology for processor cores

Li Chen, S. Dey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2001 · 231 citations

Engineering, Computer Engineering, Computer Science +16

1–5 of 248

Authors

658

XW
Xiaoqing Wen
Kyushu Institute of Technology, Japan
19 publications · 537 citations
14
h-index
KM
Kohei Miyase
Kyushu Institute of Technology, Japan
14 publications · 366 citations
13
h-index
KT
Kun-Han Tsai
Mentor Technologies, United States
12 publications · 405 citations
11
h-index
SK
Seiji Kajihara
Kyushu Institute of Technology, Japan
12 publications · 421 citations
11
h-index
SR
S.M. Reddy
University of Iowa, United States
11 publications · 399 citations
10
h-index

1–5 of 658

Institutions

165

1–8 of 165

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
18 publications · 741 citations
15
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
12 publications · 335 citations
11
h-index
Proceedings - ACM IEEE Design Automation Conference
8 publications · 246 citations
8
h-index
IEEE Design & Test of Computers
6 publications · 478 citations
6
h-index
IEEE Transactions on Computers
4 publications · 207 citations
4
h-index

1–5