Kun-Han Tsai

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 400 citations

Engineering, Industrial Engineering, Mem Testing +18

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 158 citations

Total Quality Management, Engineering, Diagnosis +20

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Xijiang Lin, Kun-Han Tsai, Chen Wang et al. · Proceedings - Asian Test Symposium/Proceedings · 2006 · 132 citations

Engineering, New Atpg Methodology, Mem Testing +16

Oscillation-Based Prebond TSV Test

Li-Ren Huang, Shi‐Yu Huang, Stephen Sunter et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2013 · 72 citations

Engineering, Integrated Circuits, Prebond Through-silicon Vias +18

Compactor independent direct diagnosis

Wu-Tung Cheng, Kun-Han Tsai, Yu Huang et al. · 2005 · 65 citations

Fault Diagnosis, Engineering, Intelligent Diagnostics +20