Concepedia

Bridging Fault Testing

Bridging Fault Testing is a diagnostic method within built-in self-test frameworks that specifically detects unintended electrical connections between signal lines in integrated circuits by analyzing abnormal logic behavior resulting from such shorts.

125

Publications

3.9K

Citations

198

Authors

88

Institutions

Publications per year

2017–2026

2

Parents

Publications

125

Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm

T. Bartenstein, D. Heaberlin, L.M. Huisman et al. · 2002 · 208 citations

, , +16

Test Pattern Generation for Realistic Bridge Faults in CMOS ICs

F.J. Ferguson, T. Larrabee · 2005 · 138 citations

, , +16

Testing for Bridging Faults (Shorts) in CMOS Circuits

John M. Acken · Design Automation Conference · 1983 · 131 citations

, , +15

Testing for Bridging Faults (Shorts) in CMOS Circuits

J.M. Acken · 20th Design Automation Conference Proceedings · 1983 · 125 citations

, , +15

A Practical Approach to Fault Simulation and Test Generation for Bridging Faults

Abramovici, Menon · IEEE Transactions on Computers · 1985 · 98 citations

, , +12

1–5 of 125

Authors

198

  1. MB
    Mehdi B. Tahoori

    Karlsruhe Institute of Technology, Germany

    7 publications · 192 citations

    7

    h-index

  2. DW
    D.M.H. Walker

    Texas A&M University, United States

    7 publications · 233 citations

    7

    h-index

  3. MF
    M. Favalli

    University of Bologna, Italy

    6 publications · 103 citations

    6

    h-index

  4. MB
    M.A. Breuer

    University of Southern California, United States

    6 publications · 171 citations

    6

    h-index

  5. FL
    Fabrizio Lombardi

    Northeastern University, United States

    5 publications · 81 citations

    5

    h-index

1–5 of 198

Institutions

88

  1. University of Illinois Urbana-Champaign

    Urbana, United States

    9 h-index

    15 publications

    409 citations

  2. Northeastern University

    Boston, United States

    7 h-index

    7 publications

    175 citations

  3. Texas A&M University

    College Station, United States

    7 h-index

    12 publications

    364 citations

  4. Intel (United States)

    Santa Clara, United States

    7 h-index

    9 publications

    426 citations

  5. University of Southern California

    Los Angeles, United States

    7 h-index

    16 publications

    433 citations

  6. Universitat Politècnica de Catalunya

    Barcelona, Spain

    6 h-index

    12 publications

    348 citations

  7. University at Buffalo, State University of New York

    Buffalo, United States

    6 h-index

    11 publications

    255 citations

  8. Stanford University

    Stanford, United States

    6 h-index

    8 publications

    329 citations

1–8 of 88

Venues

  1. 11

    h-index

  2. IEEE Transactions on Computers

    13 publications · 370 citations

    11

    h-index

  3. Journal of Electronic Testing

    JETTA · 4 publications · 92 citations

    4

    h-index

  4. IEEE Design & Test of Computers

    2 publications · 60 citations

    2

    h-index

  5. 2

    h-index

1–5