F.J. Ferguson

Extraction and simulation of realistic CMOS faults using inductive fault analysis

F.J. Ferguson, John Paul Shen · 2003 · 256 citations

Engineering, Computer Engineering, Electrical Engineering +12

A CMOS fault extractor for inductive fault analysis

F.J. Ferguson, John Paul Shen · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 205 citations

Engineering, Computer Engineering, Electrical Engineering +16

Defect classes-an overdue paradigm for CMOS IC testing

C.F. Hawkins, J.M. Soden, Alan Righter et al. · 2002 · 203 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Carafe: an inductive fault analysis tool for CMOS VLSI circuits

A. Jee, F.J. Ferguson · 2002 · 182 citations

Engineering, Computer Engineering, Electrical Engineering +15

Test Pattern Generation for Realistic Bridge Faults in CMOS ICs

F.J. Ferguson, T. Larrabee · 2005 · 138 citations

Engineering, Computer Engineering, Electrical Engineering +16