J.M. Soden - Concepedia

Author

J.M. Soden

Sandia National Laboratories

Also Known As

J M Soden, J. M. Soden, J. Soden, J.M. Soden, Jerry M. Soden, Jerry Soden, Soden, J. M.

104

Publications

2.6K

Citations

H-Index

Concepts

All Affiliations

Sandia National Laboratories University of New Mexico Sandia National Laboratories California

About

J.M. Soden is an author at Sandia National Laboratories specializing in engineering, computer engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	39	2.1K
2	Computer Engineering	22	33	1.9K
3	Applied Physics	9	9	492
4	Education	1	1	73
5	Natural Sciences	1	1	45

J.M. Soden

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
Defect classes-an overdue paradigm for CMOS IC testing C.F. Hawkins, J.M. Soden, Alan Righter, EngineeringMem TestingVerificationComputer ArchitectureSoftware Engineering	2002	203
Quiescent power supply current measurement for CMOS IC defect detection C.F. Hawkins, J.M. Soden, R.R. Fritzemeier, IEEE Transactions on Industrial Electronics ReliabilityElectrical EngineeringParasitic Transistor LeakageEngineeringHardware Reliability	1989	145
Electrical properties and detection methods for CMOS IC defects J.M. Soden, C.F. Hawkins EngineeringCmos Failure ModesIntegrated CircuitsHardware SystemsReliability Engineering	2003	140
Test Considerations for Gate Oxide Shorts in CMOS ICs J.M. Soden, C.F. Hawkins IEEE Design & Test of Computers Hardware SecurityReliabilityElectrical EngineeringReliability EngineeringEngineering	1986	138
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. C.F. Hawkins, J.M. Soden International Test Conference Low-power ElectronicsDevice ModelingElectrical EngineeringFunctional ModelsEngineering	1985	135
Reliability and electrical properties of gate oxide shorts in CMOS ICs J.M. Soden, C.F. Hawkins International Test Conference Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityGate Oxide Shorts	1986	134
CMOS IC stuck-open-fault electrical effects and design considerations J.M. Soden, R.K. Treece, Martin Taylor, Hardware SecurityI/sub Ddq/Electrical EngineeringEngineeringCircuit System	2003	108
THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS C.L. Henderson, J.M. Soden, C.F. Hawkins	2005	96
The Effects of Test Conditions on MOS Radiation-Hardness Results P. V. Dressendorfer, J.M. Soden, J. J. Harrington, IEEE Transactions on Nuclear Science Materials EngineeringElectrical EngineeringEngineeringPhysicsRadiation-hardness Testing	1981	76
IC failure analysis: techniques and tools for quality reliability improvement J.M. Soden, Richard E. Anderson Proceedings of the IEEE EngineeringMicroscopyMeasurementEducationIc Failure Analysis	1993	73

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