C.F. Hawkins - Concepedia

Author

C.F. Hawkins

Also Known As

C F Hawkins, C Hawkins, C. F. Hawkins, C. Hawkins, C.F. Hawkins, CRYSTAN HAWKINS, Catherine E. Hawkins, Charles F. Hawkins, Charles Hawkins, Clifford Hawkins

161

Publications

3.7K

Citations

H-Index

108

Concepts

All Affiliations

University of New Mexico Sandia National Laboratories Intel (United States)Universitat de les Illes Balears Sandia National Laboratories California

About

C.F. Hawkins is an author at University of New Mexico specializing in engineering, computer engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	32	52	2.8K
2	Education	5	5	144
3	Business	2	2	48
4	Management	2	2	46
5	Health Sciences	1	1	15

C.F. Hawkins

Publications

Citations

H-Index

Page 1

	Year	Citations
Intrinsic leakage in low power deep submicron CMOS ICs A. Keshavarzi, Kaushik Roy, C.F. Hawkins Hardware SecurityI/sub Ddq/Electrical EngineeringEngineeringVlsi Design	2002	203
Defect classes-an overdue paradigm for CMOS IC testing C.F. Hawkins, J.M. Soden, Alan Righter, EngineeringMem TestingVerificationComputer ArchitectureSoftware Engineering	2002	203
Quiescent power supply current measurement for CMOS IC defect detection C.F. Hawkins, J.M. Soden, R.R. Fritzemeier, IEEE Transactions on Industrial Electronics ReliabilityElectrical EngineeringParasitic Transistor LeakageEngineeringHardware Reliability	1989	145
Electrical properties and detection methods for CMOS IC defects J.M. Soden, C.F. Hawkins EngineeringCmos Failure ModesIntegrated CircuitsHardware SystemsReliability Engineering	2003	140
Test Considerations for Gate Oxide Shorts in CMOS ICs J.M. Soden, C.F. Hawkins IEEE Design & Test of Computers Hardware SecurityReliabilityElectrical EngineeringReliability EngineeringEngineering	1986	138
Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. C.F. Hawkins, J.M. Soden International Test Conference Low-power ElectronicsDevice ModelingElectrical EngineeringFunctional ModelsEngineering	1985	135
Reliability and electrical properties of gate oxide shorts in CMOS ICs J.M. Soden, C.F. Hawkins International Test Conference Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityGate Oxide Shorts	1986	134
Defect-based delay testing of resistive vias-contacts a critical evaluation K. Baker, G. Gronthoud, M. Lousberg, Defect-based StudyDefect-based Delay TestingElectrical EngineeringReliability EngineeringEngineering	2003	129
Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's A. Keshavarzi, S. Narendra, Shekhar Borkar,	1999	108
CMOS IC stuck-open-fault electrical effects and design considerations J.M. Soden, R.K. Treece, Martin Taylor, Hardware SecurityI/sub Ddq/Electrical EngineeringEngineeringCircuit System	2003	108

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