C.F. Hawkins

Intrinsic leakage in low power deep submicron CMOS ICs

A. Keshavarzi, Kaushik Roy, C.F. Hawkins · 2002 · 203 citations

Hardware Security, I/sub Ddq/, Electrical Engineering +12

Defect classes-an overdue paradigm for CMOS IC testing

C.F. Hawkins, J.M. Soden, Alan Righter et al. · 2002 · 203 citations

Engineering, Mem Testing, Verification +19

Quiescent power supply current measurement for CMOS IC defect detection

C.F. Hawkins, J.M. Soden, R.R. Fritzemeier et al. · IEEE Transactions on Industrial Electronics · 1989 · 145 citations

Reliability, Electrical Engineering, Parasitic Transistor Leakage +12

Electrical properties and detection methods for CMOS IC defects

J.M. Soden, C.F. Hawkins · 2003 · 140 citations

Engineering, Cmos Failure Modes, Integrated Circuits +16

Test Considerations for Gate Oxide Shorts in CMOS ICs

J.M. Soden, C.F. Hawkins · IEEE Design & Test of Computers · 1986 · 138 citations

Hardware Security, Reliability, Electrical Engineering +15