Concepedia

Built-in Current Testing

Built-In Current Testing is a built-in self-test methodology that detects faults in integrated circuits by monitoring supply current anomalies during testing, distinguishing itself from other techniques through its reliance on quiescent or dynamic current signatures rather than voltage-based logic responses.

32

Publications

1.3K

Citations

80

Authors

29

Institutions

Publications per year

2017–2026

0

Variants

Iddq TestingQuiescent Current Testing

Parents

Publications

32

Built-in current testing-feasibility study

W. Maly, P. Nigh · 2003 · 223 citations

, , +15

Test generation for current testing (CMOS ICs)

P. Nigh, W. Maly · IEEE Design & Test of Computers · 1990 · 128 citations

, , +13

Built-in current testing

W. Maly, M.J. Patyra · IEEE Journal of Solid-State Circuits · 1992 · 96 citations

, , +13

Current sensing for built-in testing of CMOS circuits

D.B.I. Feltham, P. Nigh, L.R. Carley et al. · 2003 · 86 citations

, , +17

Design of ICs applying built-in current testing

W. Maly, M.J. Patyra · Journal of Electronic Testing · 1992 · 65 citations

, , +12

1–5 of 32

Authors

80

  1. WM
    W. Maly

    Carnegie Mellon University, United States

    7 publications · 661 citations

    7

    h-index

  2. PN
    P. Nigh

    IBM (United States), United States

    5 publications · 494 citations

    5

    h-index

  3. MP
    M.J. Patyra

    Intel (United States), United States

    3 publications · 177 citations

    3

    h-index

  4. JL
    Jien-Chung Lo

    University of Rhode Island, United States

    2 publications · 81 citations

    2

    h-index

  5. TS
    Tung-Li Shen

    University of Rhode Island, United States

    2 publications · 81 citations

    2

    h-index

1–5 of 80

Institutions

29

  1. Carnegie Mellon University

    Pittsburgh, United States

    8 h-index

    16 publications

    1.4K citations

  2. Universitat Politècnica de Catalunya

    Barcelona, Spain

    4 h-index

    10 publications

    184 citations

  3. Auburn University

    Auburn, United States

    2 h-index

    2 publications

    46 citations

  4. University of Rhode Island

    Kingston, United States

    2 h-index

    3 publications

    142 citations

  5. United Microelectronics (Taiwan)

    Hsinchu, Taiwan

    2 h-index

    3 publications

    101 citations

  6. RTI International

    Durham, United States

    2 h-index

    3 publications

    58 citations

  7. Texas A&M University

    College Station, United States

    2 h-index

    4 publications

    98 citations

  8. National Dong Hwa University

    Hualien City, Taiwan

    1 h-index

    3 publications

    60 citations

1–8 of 29

Venues

  1. IEEE Journal of Solid-State Circuits

    5 publications · 251 citations

    5

    h-index

  2. IEEE Design & Test of Computers

    2 publications · 153 citations

    2

    h-index

  3. Electronics Letters

    1 publications · 18 citations

    1

    h-index

  4. Journal of Electronic Testing

    JETTA · 1 publications · 65 citations

    1

    h-index

  5. 1

    h-index

1–5