D.B.I. Feltham

Current sensing for built-in testing of CMOS circuits

D.B.I. Feltham, P. Nigh, L.R. Carley et al. · 2003 · 86 citations

Engineering, Vlsi Design, Measurement +17

Pentium(R) Pro processor design for test and debug

A. Carbine, D.B.I. Feltham · 2002 · 77 citations

Hardware Security, Reliability Engineering, Engineering +14

Full Hold-Scan Systems in Microprocessors: Cost/Benefit Analysis

R. Kuppuswamy, D.B.I. Feltham, Rehan Sheikh · 2004 · 63 citations

Engineering, Mem Testing, Computer Architecture +19

Physically realistic fault models for analog CMOS neural networks

D.B.I. Feltham, W. Maly · IEEE Journal of Solid-State Circuits · 1991 · 58 citations

Engineering, Vlsi Design, Neural Networks (Machine Learning) +20

Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits

J. Khare, D.B.I. Feltham, W. Maly · IEEE Journal of Solid-State Circuits · 1993 · 48 citations

Defect Tolerance, Electrical Engineering, Reliability Engineering +15