J. Khare

Yield-oriented computer-aided defect diagnosis

J. Khare, W. Maly, S. Griep et al. · IEEE Transactions on Semiconductor Manufacturing · 1995 · 60 citations

Software Maintenance, Fault Diagnosis, Engineering +17

Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits

J. Khare, D.B.I. Feltham, W. Maly · IEEE Journal of Solid-State Circuits · 1993 · 48 citations

Defect Tolerance, Electrical Engineering, Reliability Engineering +15

Design for manufacturability in submicron domain

W. Maly, H.T. Heineken, J. Khare et al. · International Conference on Computer Aided Design · 1996 · 45 citations

Engineering, Industrial Engineering, Electronic Design +16

Extraction of defect size distributions in an IC layer using test structure data

J. Khare, W. Maly, Michael E. Thomas · IEEE Transactions on Semiconductor Manufacturing · 1994 · 44 citations

Engineering, Size Distribution Parameters, Defect Tolerance +19

Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring

J.T. Chen, J. Khare, K.D. Walker et al. · 2002 · 32 citations

Hardware Security, Memory Architecture, Engineering +15