J. Khare - Concepedia

Author

J. Khare

Carnegie Mellon University

Also Known As

J. Khare, J.B. Khare, Jitendra B. Khare, Jitendra Khare

Publications

592

Citations

H-Index

Concepts

All Affiliations

Carnegie Mellon University Siemens (Germany)L-3 Communications (United States)Intel (United States)

About

J. Khare is an author at Carnegie Mellon University specializing in engineering, computer engineering, and computer architecture.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	466
2	Computer Engineering	14	17	466
3	Social Sciences	5	5	111
4	Electrical Engineering	5	5	148
5	Computer Science	3	3	74

J. Khare

Publications

466

Citations

H-Index

Page 1

	Year	Citations
Yield-oriented computer-aided defect diagnosis J. Khare, W. Maly, S. Griep, IEEE Transactions on Semiconductor Manufacturing Software MaintenanceFault DiagnosisEngineeringIndustrial EngineeringDefect Parameters	1995	60
Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits J. Khare, D.B.I. Feltham, W. Maly IEEE Journal of Solid-State Circuits Defect ToleranceElectrical EngineeringReliability EngineeringEngineeringVlsi Design	1993	48
Design for manufacturability in submicron domain W. Maly, H.T. Heineken, J. Khare, International Conference on Computer Aided Design EngineeringIndustrial EngineeringElectronic DesignComputer ArchitectureSubmicron Domain	1996	45
Extraction of defect size distributions in an IC layer using test structure data J. Khare, W. Maly, Michael E. Thomas IEEE Transactions on Semiconductor Manufacturing EngineeringSize Distribution ParametersDefect ToleranceReliability EngineeringYield Management	1994	44
Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring J.T. Chen, J. Khare, K.D. Walker, Hardware SecurityMemory ArchitectureEngineeringMemory AnalysisSoftware Testing	2002	32
Inductive contamination analysis (ICA) with SRAM application J. Khare, W. Maly Hardware ModelingEngineeringVlsi DesignMem TestingComputer Architecture	2002	31
Fault characterization of standard cell libraries using inductive contamination analysis (ICA) J. Khare, W. Maly, N. Tiday Electrical EngineeringReliability EngineeringInductive Contamination AnalysisEngineeringHardware Reliability	2002	26
Yield loss forecasting in the early phases of the VLSI design process H.T. Heineken, J. Khare, W. Maly EngineeringVlsi DesignIndustrial EngineeringComputer-aided DesignCritical Area	2002	26
Enabling embedded memory diagnosis via test response compression J.T. Chen, Janusz Rajski, J. Khare, EngineeringMem TestingComputer ArchitectureEmbedded SystemsSoftware Analysis	2002	25
CAD at the design-manufacturing interface H.T. Heineken, J. Khare, W. Maly, EngineeringElectronic Design AutomationElectronic DesignComputer ArchitectureSoftware Engineering	1997	23

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