Michael E. Thomas - Concepedia

Author

Michael E. Thomas

Johns Hopkins University Applied Physics Laboratory ORCID

Also Known As

M E Thomas, M THOMAS, M Thomas, M. E. THOMAS, M. E. Thomas, M. Thomas, M.E. Thomas, MICHAEL E. THOMAS, MICHAEL THOMAS, Merin Mariam Thomas

338

Publications

3.7K

Citations

H-Index

196

Concepts

All Affiliations

Johns Hopkins University Applied Physics Laboratory Johns Hopkins University Leibniz University Hannover Texas Instruments (United States)Fairchild Semiconductor (United States)

About

Michael E. Thomas is an author at Johns Hopkins University Applied Physics Laboratory specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	23	52	1.6K
2	Natural Sciences	13	16	496
3	Business	2	2	87
4	Medicine	2	2	33
5	Management	1	1	16

Michael E. Thomas

Publications

1.9K

Citations

H-Index

Page 1

	Year	Citations
Lithium mobility in the layered oxide Li1−xCoO2 Michael E. Thomas, P BRUCE, John B. Goodenough Solid State Ionics Materials ScienceEngineeringLithium-ion BatteryEnergy StorageChemistry	1985	178
Phase equilibria in thin-film metallizations R. Beyers, Rodney Sinclair, Michael E. Thomas Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena Materials ScienceInorganic ChemistryTernary Phase DiagramsEngineeringPhase Equilibrium	1984	157
Infrared transmission properties of sapphire, spinel, yttria, and ALON as a function of temperature and frequency Michael E. Thomas, Richard I. Joseph, William J. Tropf Applied Optics	1988	114
High-temperature infrared properties of sapphire, AlON, fused silica, yttria, and spinel Raymond M. Sova, Milton J. Linevsky, Michael E. Thomas, Infrared Physics & Technology High-temperature Infrared PropertiesOptical MaterialsEngineeringGlowing Yttria SampleLaser Applications	1998	94
Frequency and temperature dependence of the refractive index of sapphire Michael E. Thomas, Stefan Andersson, Raymond M. Sova, Infrared Physics & Technology Optical MaterialsEngineeringOptic DesignOptical GlassOptical Testing	1998	79
Statistical Analysis of Extreme Values: From Insurance, Finance, Hydrology and Other Fields Alexander J. McNeil, R-D. Reiss, Michael E. Thomas Journal of the American Statistical Association EngineeringRare Event EstimationRisk MetricHydrologic HazardRisk Analysis	1998	71
Preventing Cell-to-Cell Propagation of Thermal Runaway in Lithium-Ion Batteries R. Srinivasan, Michael E. Thomas, Marc B. Airola, Journal of The Electrochemical Society EngineeringThermodynamicsBiophysicsTrigger CellMaterials Science	2020	62
On Towers and Composita of Towers of Function Fields over Finite Fields Arnaldo Garcia, Henning Stichtenoth, Michael E. Thomas Finite Fields and Their Applications Finite GeometryFunction FieldsFinite FieldsRing TheoryFinite Field	1997	47
Extraction of defect size distributions in an IC layer using test structure data J. Khare, W. Maly, Michael E. Thomas IEEE Transactions on Semiconductor Manufacturing EngineeringSize Distribution ParametersDefect ToleranceReliability EngineeringYield Management	1994	44
AC impedance of the Li(1−x)CoO2 electrode Michael E. Thomas, P BRUCE, John B. Goodenough Solid State Ionics Materials ScienceElectrical EngineeringEngineeringBattery Electrode MaterialsElectrode-electrolyte Interface	1986	41

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