Concepedia

Delay Fault Testing

Delay Fault Testing is a test methodology within the broader class of structural fault testing techniques that specifically targets defects causing unacceptable propagation delays in digital circuits by verifying whether signal transitions occur within prescribed time constraints.

485

Publications

17.9K

Citations

769

Authors

212

Institutions

Publications per year

2017–2026

10

Parents

Publications

485

On Delay Fault Testing in Logic Circuits

Chin Jen Lin, S.M. Reddy · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 562 citations

, , +16

Transition Fault Simulation

J.A. Waicukauski, Eric Lindbloom, Barry K. Rosen et al. · IEEE Design & Test of Computers · 1987 · 402 citations

, , +16

Too much delay fault coverage is a bad thing

Jeff Rearick · 2002 · 264 citations

, , +17

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

, , +14

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Santiago Remersaro, Xijiang Lin, Zhuo Zhang et al. · Proceedings/Proceedings - International Test Conference · 2006 · 239 citations

, , +17

1–5 of 485

Authors

769

  1. SR
    S.M. Reddy

    University of Iowa, United States

    40 publications · 2.3K citations

    24

    h-index

  2. KC
    Kwang‐Ting Cheng

    University of California, Santa Barbara, United States

    30 publications · 1.5K citations

    20

    h-index

  3. IP
    Irith Pomeranz

    University of Iowa, United States

    31 publications · 1.2K citations

    18

    h-index

  4. VD
    Vishwani D. Agrawal

    AT&T (United States), United States

    26 publications · 759 citations

    17

    h-index

  5. SP
    S. Pravossoudovitch

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    17 publications · 388 citations

    14

    h-index

1–5 of 769

Institutions

212

  1. University of Iowa

    Iowa City, United States

    25 h-index

    70 publications

    4.8K citations

  2. IBM (United States)

    Armonk, United States

    18 h-index

    60 publications

    4.6K citations

  3. University of California, Santa Barbara

    Santa Barbara, United States

    18 h-index

    65 publications

    2.6K citations

  4. AT&T (United States)

    Bedminster, United States

    18 h-index

    28 publications

    1.4K citations

  5. Purdue University West Lafayette

    West Lafayette, United States

    16 h-index

    38 publications

    1.2K citations

  6. The University of Texas at Austin

    Austin, United States

    16 h-index

    33 publications

    1.3K citations

  7. Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier

    Montpellier, France

    15 h-index

    84 publications

    1.9K citations

  8. Centre National de la Recherche Scientifique

    Paris, France

    14 h-index

    86 publications

    1.8K citations

1–8 of 212

Venues

  1. 28

    h-index

  2. 14

    h-index

  3. IEEE Transactions on Computers

    13 publications · 623 citations

    12

    h-index

  4. IEEE Design & Test of Computers

    10 publications · 1.1K citations

    10

    h-index

  5. Journal of Electronic Testing

    JETTA · 10 publications · 188 citations

    10

    h-index

1–5