Patrick Girard

Survey of low-power testing of VLSI circuits

Patrick Girard · IEEE Design & Test of Computers · 2002 · 439 citations

Engineering, Computer Engineering, Electrical Engineering +17

Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

Patrick Girard, Gaëtan Lévêque · Journal of Applied Physics · 1997 · 271 citations

Natural Sciences, Biophysics, Physics +15

Characterization of an SRAM based particle detector for mixed-field radiation environments

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio et al. · 2013 · 195 citations

Engineering, Electrical Engineering, Nuclear Engineering +15

A test vector inhibiting technique for low energy BIST design

Patrick Girard, L. Guiller, C. Landrault et al. · 2003 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +15

A gated clock scheme for low power scan testing of logic ICs or embedded cores

Yannick Bonhomme, Patrick Girard, L. Guiller et al. · 2002 · 141 citations

Engineering, Computer Engineering, Electrical Engineering +17