R. Madge

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 158 citations

Total Quality Management, Engineering, Diagnosis +20

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

R. Madge, Madan M. Rehani, K. Cota et al. · 2003 · 90 citations

Engineering, Industrial Engineering, Mem Testing +23

Screening minVDD outliers using feed-forward voltage testing

R. Madge, B. H. T. Goh, Venkatesh Rajagopalan et al. · 2003 · 66 citations

Electrical Engineering, Reliability Engineering, Low Voltage Testing +12

In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

R. Madge, Brady Benware, Ritesh Turakhia et al. · 2005 · 55 citations

Search Optimization, Engineering, Mem Testing +17

Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs

Brady Benware, R. Madge, Cheng-Tse Lu et al. · 2003 · 45 citations

Engineering, Defect Tolerance, Reliability Engineering +17